Computer Vision Machine Learning Lab
Jisoo Park cosmopark624@gmail.com
Conference
- Automatic Stylized Plaid Check Pattern Try-on
- Automatic Stylized Plaid Check Pattern Try-on
Jisoo Kim, Jisoo Park, and Junseok Kwon, The 12th International Conference on ICT Convergence (ICTC), Jeju Island, Korea. 2021 [pdf]
ACK: National Program for Excellence in SW (20170001000051001) , LINC+
Journal
Patents