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27. Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals
27. Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals
Adv. Electron. Mater. 2017, 3, 1700117. DOI: 10.1002/aelm.201700117
Authors
Authors
Christopher J. Douglas
C. Daniel Frisbie
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