Adv. Electron. Mater. 2017, 3, 1700018. DOI: 10.1002/aelm.201700018
Xinglong Ren
Matthew J. Bruzek
David A. Hanifi
Aaron Schulzetenberg
Yanfei Wu
Chang-Hyun Kim
Zhuoran Zhang
James E. Johns
Alberto Salleo
Simone Fratini
Alessandro Troisi
Christopher J. Douglas
C. Daniel Frisbie