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Sr. No.TitleJournal / ConferenceYear of publicationType of publication(Co)Author(s)
1. Temperature and field dependent low frequency noise characterization of Ge n-FETs Journal 2016 International Sayantan Ghosh, Piyush Bhatt, Chandan Joishi 
Low Frequency Noise and Mobility Correlation from RT to Low Temperatures for n-Channel Ge MOSFETs Conference 2015 International Sayantan Ghosh, Piyush Bhatt 
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