Kurzbiographie und Publikationsliste
Persönliche Daten / Kontakt
Name: Dr. Thomas Wieder
Geburtstag: 25. März 1961
Email: thomas.wieder@t-online.de
Mitgliedschaften / Memberships
Berufliche Laufbahn
1985: Physik-Diplom (Universität Kassel, Prof. Dr. Otto Böttger)
1988: Promotion, Dr. rer. nat. (Universität Kassel, Prof. Dr. Helmut Gärtner)
1997: Habilitation, Fach Strukturforschung (Technische Universität Darmstadt, Prof. Dr. Dr. Hartmut Fueß)
1995 - 2000: Hochschulassistent (befristet) an der Technischen Universität Darmstadt
1998 - 2003: Privatdozent an der Technischen Universität Darmstadt
2001 - 2024: Tätigkeit in der Energiewirtschaft
Seit 2024: Im Ruhestand
Forschungsinteressen
Röntgen- und Neutronenbeugung, Physik, Computational Physics, Soziophysik
Lehre
Aktuell keine Lehrtätigkeiten
Meine Veröffentlichungen / My publications
Referierte Zeitschriften:
Thomas Wieder:
A simple matrix alteration method;
Applied Mathematical Sciences 13(14) (2019), 685 - 695.
https://doi.org/10.12988/ams.2019.9798
Thomas Wieder:
A toy model for hostility between two populations in dependency on their internal frustration;
International Mathematical Forum, 9(32) (2014), 1581 - 1593.
http://dx.doi.org/10.12988/imf.2014.49168
Thomas Wieder:
On the use of strategies attached to subpopulations in the description of competition among different populations;
http://dx.doi.org/10.12988/imf.2014.49168
International Mathematical Forum, 8(37) (2013), 1839 - 1851.
http://dx.doi.org/10.12988/imf.2013.310185
Thomas Wieder:
International Mathematical Forum 7(54) (2012), 2681 - 2686.
Thomas Wieder:
The Debye scattering formula in n dimensions;
Journal of Mathematical and Computational Science 2(4) (2012), 1086 - 1090.
Thomas Wieder:
Generation of all possible multiselections from a multiset;
Progress in Applied Mathematics 2(1) (2011), 61 - 66.
http://dx.doi.org/10.3968/j.pam.1925252820110201.010
Thomas Wieder:
A simple differential equation system for the description of competition among religions;
International Mathematical Forum 6(35) (2011), 1713 - 1723.
Thomas Wieder:
The number of certain rankings and hierarchies formed from labeled or unlabeled elements and sets;
Applied Mathematical Sciences 3(55) (2009), 2707 - 2724.
Thomas Wieder:
The Number Of Certain k-Combinations Of An n-Set;
Applied Mathematical E-Notes 8 (2008), 45 - 52.
Y. Wali, A. Njeh, T. Wieder and M. H. Ben Ghozlen:
NDT and E International 40(7) (2007), 545 - 551.
N. J. A. Sloane and T. Wieder:
The Number of Hierarchical Orderings;
Order 21(1) (2004), 83 - 89.
http://arxiv.org/PS_cache/math/pdf/0307/0307064v1.pdf
Anouar Njeh, Thomas Wieder, Mohamed Hédi Ben Ghozlen and Hartmut Fuess:
Materials Characterization 52(2) (2004), 135 - 143.
Local copy with permission from Elsevier.
A. Hohl, T. Wieder, P. A. van Aken, T. E. Weirich, G. Denninger, M. Vidal, S. Oswald, C. Deneke, J. Mayer, H. Fuess:
An interface clusters mixture model for the structure of amorphous silicon monoxide (SiO);
Journal of Non-Crystalline Solids 320 (2003), 255 - 280.
Local copy with permisson from Elsevier.
M. Hoelzel, S.A. Danilkin, A. Hoser, H. Ehrenberg, T. Wieder, H. Fuess:
Phonon dispersion in austenitic stainless steel Fe-18Cr-12Ni-2Mo;
Applied Physics A 74 (2002, Suppl.), S1013 - S1015.
http://dx.doi.org/10.1007/s003390101177
A. Njeh, T. Wieder, H. Fuess:
Reflectometry studies of the oxidation kinetics of thin copper films;
Surface and Interface Analysis 33 (2002), 626 - 628.
A. Njeh, T. Wieder, D. Schneider, H. Fuess, M.H. Ben Ghozlen:
Surface wave propagation in thin silver films;
Zeitschrift für Naturforschung 57a (2002), 1220 - 1225.
T. Wieder:
Iterative unfolding of two-dimensional data by Siska's method;
Journal of Applied Crystallography 34 (2001), 786.
Reprinted with permission from Journal of Applied Crystallography. Download here!
J. Sigmund, M. Saglam, A. Vogt, H.L. Hartnagel, V. Buschmann, T. Wieder, H. Fuess:
Journal of Crystal Growth 227-228 (2001), 625 - 629.
Local copy with permisson from Elsevier.
S.A. Danilkin, H. Fuess, T. Wieder, A. Hoser:
Phonon dispersion and elastic constants in Fe-Cr-Mn-Ni austenitic steel;
Journal of Materials Science 36 (2001), 811 - 814.
T. Wieder:
On the strain-free lattice constants in residual stress evaluation by diffraction;
Journal of Structural Geology 22 (2000), 1601 - 1607.
Local copy with permission from Elsevier.
A. Njah, T. Wieder, H. Fuess:
Powder Diffraction 15 (2000), 211 - 216.
According to Cambridge Journals’ Open Access Archive Policy, a local copy is available here.
T. Wieder:
Numerical Hankel transform by the Fortran program HANKEL;
Transactions on Mathematical Software (TOMS) 25 (1999), 240 - 250.
calgo.acm.org/793.gz http://www.netlib.no/netlib/toms/794
A. Beskrovni, S. Danilkin, H. Fuess, E. Jadrowski, M. Neova-Baeva, T. Wieder:
Effect of Cr Content on the Crystal Structure and Lattice Dynamics of
FCC Fe-Cr-Ni-N Austenitic Alloys;
Journal of Alloys and Compounds 291 (1999), 261 - 268.
Local copy with permission from Elsevier.
T. Wieder, T. Pirling, A. Neubrand, H. Fuess:
Yield stress increase in a W/Cu-composite observed by neutron diffraction;
Journal of Materials Science Letters 18 (1999), 1135 - 1137.
T. Wieder:
A generalized Debye scattering formula and the Hankel transform;
Zeitschrift für Naturforschung 54a (1999), 124 - 130.
S. Danilkin, H. Fuess, E. Jadrowski, T. Wieder, H. Wipf:
X-ray and neutron scattering study of the Nb-O solid solutions;
Journal of Alloys and Compounds 266 (1998), 230 - 233.
Local copy with permission from Elsevier.
T. Wieder, H. Fuess:
A generalized Debye scattering equation;
Zeitschrift für Naturforschung 52a (1997), 386 - 392.
T. Wieder:
Applied Physics Letters 69 (1996), 2495 - 2497.
link.aip.org/link/?APPLAB/69/2495/1
Reprinted with permission from Applied Physics Letters. Copyright [1995], American Institute of Physics. Download here!
T. Wieder:
WVM: A computer program for the determination of lattice parameters and strains in thin films;
Computer Physics Communications 96 (1996), 53 - 60.
http://www.cpc.cs.qub.ac.uk/ Local copy with permisson from Elsevier.
J. Zendehroud, T. Wieder, H. Klein:
Determination of Stress Tensors in Thin Textured Copper Films by Grazing Incidence Diffraction;
Materialwissenschaft und Werkstofftechnik 26 (1995), 553 - 559.
T. Wieder:
Calculation of thermally induced strains in thin films of any crystal class;
Journal of Applied Physics 78 (1995), 838 - 841.
link.aip.org/link/?JAPIAU/78/838/1
Reprinted with permission from Journal of Applied Physics. Copyright [1995], American Institute of Physics.
This article may be downloaded for personal us only. Any other use requires prior permission of the author and the American Institute of Physics. Download here!
T. Wieder:
Computer Physics Communication 85 (1995), 398 - 414.
http://www.cpc.cs.qub.ac.uk/ Local copy with permisson from Elsevier.
J. Zendehroud, T. Wieder, K. Thoma:
Gitterkonstantenbestimmung in kubischen dünnen Schichten unter thermischer Dehnung;
Materialwissenschaft und Werkstoffkunde 26 (1995), 386 - 393.
T. Wieder:
Thin Solid Films 256 (1995), 39 - 43.
Local copy with permission from Elsevier.
I. Levin, W.D. Kaplan, T. Wieder and D. Brandon:
Residual Stresses in Alumina-SiC Nanocomposites;
Acta Metallurgica et Materialia 42 (1994), 1147 - 1154.
Local copy with permission from Elsevier.
G. Kimmel, L. Politi, T. Wieder:
Characterization of (Ti,Al)N Films by XRD and XRF;
Advances in X-ray Analysis 37 (1994), 175 - 182.
T. Wieder:
SBGBBG: A Computer Program For Strain/Stress Tensor Calculation From X-Ray Diffraction Data;
Powder Diffraction 8 (1993), 214 - 215.
In accordance with Cambridge Journals’ Open Access Archive Policy, a local copy is available here.
J. Zendehroud, T. Wieder, K. Thoma, H. Gärtner.
Tiefenauflösende röntgenographische Dehnungsmessungen an TiN-Schichten in Seemann-Bohlin-Geometrie;
Härterei-Technische Mitteilungen 48 (1993), 41 - 49.
W. Siejkowski, A. Calderero-Lopez, T. Wieder and H. Gärtner:
X-Ray Analysis of Oxidized and Sulfidized Thin Nickel Films;
Metalurgia I Odlewnictwo (Polen) 17, (1991), 427 - 434.
H. Gärtner, K. Thoma, H. Volkmann, T. Wieder, A. Schmitt:
High-energy implantation of Kr+ into Ti;
Nuclear Tracks and Radiation Measurement (UK), 19 (1991), 885 - 890.
Local copy with permission from Elsevier.
T. Wieder:
Materialwissenschaft und Werkstoffkunde 22 (1991), 23 - 30.
T. Wieder, W. Herr und H. Gärtner:
Materialwissenschaft und Werkstoffkunde 20 (1989), 271 - 277.
T. Wieder, K. Thoma and H. Gärtner:
New Scattering Formula for the Analysis of X-ray Line Broadening by Composition Profiles;
Applied Physics A 46 (1988), 165-167.
http://dx.doi.org/10.1007/BF00939259
K. Thoma, R. Färber, T. Wieder and H. Gärtner:
Structure and Fatigue Properties of Ion-plated Nickel Films on Steel;
Materials Science and Engineering 90 (1987), 327 - 332.
Local copy with permission from Elsevier.
Buchbeitrag:
U. Schubert, T. Wieder:
Ein Strukturmodell des amorphen SiO;
Jutzi, Peter / Schubert, Ulrich (eds.)
Silicon Chemistry
From the Atom to Extended Systems
Wiley-VCH, Weinheim, 1. Auflage - Juli 2003
ISBN 3-527-30647-1.
Hochschulschriften:
T. Wieder:
Realstrukturaufklärung polykristalliner dünner Schichten mittels Röntgenbeugung;
Habilitationsschrift, FB Materialwissenschaft, TH Darmstadt, 1997.
Erschienen als elektronische Publikation bei Kassel University Press, ISBN 3-933146-01-1.
T. Wieder:
Eine neue Streuformel für die tiefenauflösende Röntgenstrahldiffraktometrie nach der kinematischen Theorie;
Dissertation, FB Physik, Gesamthochschule Kassel, 1988.
Konferenzberichte, Posterzusammenfassungen:
T. Wieder:
The Debye scattering formula in n dimensions;
26 European Crystallographic Meeting, Darmstadt, 2010,
Acta Crystallographica A66 (2010), 217.
A. Hohl, T. Wieder, H. Fuess:
Ramanspektroskopie an Siliciummonoxid zur Untersuchung von Kristallitgrößen und Dynamik;
XXV. Tagung des Arbeitskreises nichtkristalline und partiellkristalline Strukturen,
AK4 der Deutschen Gesellschaft für Kristallographie (DGK), Wolfersdorf bei Jena, 2004.
A. Hohl, T. Wieder, H. Fuess:
Ramanspektroskopische Untersuchung der Siliziumkristallisation in Siliziummonoxid;
XXIV. Tagung des Arbeitskreises nichtkristalline und partiellkristalline Strukturen,
AK4 der Deutschen Gesellschaft für Kristallographie (DGK), Wolfersdorf bei Jena, 2003.
A. Hohl, T. Wieder, H. Fuess:
A Structural Model For Silicon Monoxide;
Conference on Non-Crystalline Inorganic Materials, Concim 2003, Bonn, 2003.
A. Hohl, T. Wieder, V. Joco, H. Fuess:
On the Structure of Amorphous Silicon Monoxide;
ILL Konferenz, Grenoble, 2002.
A. Hohl, T. Wieder, H. Fuess:
XXIII. Tagung des Arbeitskreises nichtkristalline und partiellkristalline Strukturen,
AK4 der Deutschen Gesellschaft für Kristallographie (DGK), Jena, 2002.
N. Bickulova, S. Danilkin, H. Fuess, V. Semenov, A. Skomorokhov, T. Wieder, E. Yadrowski, Z. Yagofarova:
Lattice dynamics and phys transititions in superionic conductor Cu2-δSe;
Proceedings of the Second German-Russian User Meeting “Condensed Matter Physics with Neutrons at IBR2”,
Frank Laboratory of Neutron Physics, Dubna, Russia, 2001.
A. Hohl, T. Wieder, H. Fuess:
XXII. Tagung des Arbeitskreises nichtkristalline und partiellkristalline Strukturen,
AK4 der Deutschen Gesellschaft für Kristallographie (DGK), Wolfersdorf bei Jena, 2001.
M. Hölzel, S.A. Danilkin, A. Hoser, T. Wieder, H. Fuess:
Phonon dispersion austenitic steels;
Deutsche Neutronenstreutagung 2001, 19-21 Februar 2001, Jülich and Aachen, Abstracts, p. 14.
J. Sigmund, M. Saglam, A.Vogt, H.L. Hartnagel, V. Buschmann, T. Wieder, H. Fuess:
Microstructure analysis of Ohmic contacts on MBE grown n-GaSb layers and investigation of submicron contacts;
MBE-XI: International Conference on Molecular Beam Epitaxy, Beijing, China, 2000, Abstracts, S. 275.
A. Hohl, T. Wieder, H. Fuess:
Eine Studie zur Strukturaufklärung des Siliziummonoxids (SiO);
9. Jahrestagung der Deutschen Gesellschaft für Kristallographie, Bayreuth, 2001,
Zeitschrift für Kristallographie, Supplement Issue 18 (2001), S. 66, ISBN 3-486-64267-7..
A. Njah, T. Wieder, H. Fuess:
European Crystallographic Meeting ECM 19, Nancy 2000,
Acta Crystallographia A56 (Supplement, 2000), S. 136
Ch. Deneke, P. van Aken, T. Wieder:
Elektronen-Energieverlust-Spektroskopie an SiO und a-SiO2;
XXI. Tagung des Arbeitskreises nichtkristalline und partiellkristalline Strukturen,
AK4 der Deutschen Gesellschaft für Kristallographie (DGK), Wolfersdorf bei Jena, 2000.
Jürgen Schreiber, Achim Neubrand, Thomas Wieder, Meinhard Stalder, Nail Shamsutdinov:
Distribution of Macro- and microstress in Cu/W FGM;
Estes Park, Colorado, USA, September 10-14, 2000,
Ceramics Transactions, Volume 114, Wiley-Blackwell (2001), ISBN: 1-57498-110-2.
A. Njah, T. Wieder, H. Fuess:
Streifender Strahlausfall versus streifendem Strahleinfall für Spannungsermittlung an dünnen Schichten;
8. Jahrestagung der Deutschen Gesellschaft für Kristallographie, Aachen, 2000,
Zeitschrift für Kristallographie, Supplement Issue No. 17 (2000), S. 203, ISBN 3-486-64264-2.
H. Fueß, M. Ghafari, A. Hohl, B. Stahl, T. Wieder, M. Winterer:
Nahordnung in Fe100-xScx aus EXAFS-Spektren;
8. Jahrestagung der Deutschen Gesellschaft für Kristallographie, Aachen, 2000,
Zeitschrift für Kristallographie, Supplement Issue No. 17 (2000), S. 104, ISBN 3-486-64264-2.
T. Wieder, T. Pirling:
Eigenspannungen in einem W/Cu-Durchdringungskompositen;
7. Jahrestagung der Deutschen Gesellschaft für Kristallographie, Leipzig, 1999,
Zeitschrift für Kristallographie, Supplement Issue No. 16 (1999), S. 137, ISBN 3-486-64264-2.
D. Zheng, T. Wieder, G. Miehe:
Eine Rietveld-Verfeinerung des amorphen SiO2;
7. Jahrestagung der Deutschen Gesellschaft für Kristallographie, Leipzig, 1999,
Zeitschrift für Kristallographie, Supplement Issue No. 16 (1999), S. 131, ISBN 3-486-64264-2.
T. Wieder:
Rietveld-Analyse amorpher Strukturen;
XX. Tagung des Arbeitskreises nichtkristalline und partiellkristalline Strukturen,
AK4 der Deutschen Gesellschaft für Kristallographie (DGK), Wolfersdorf bei Jena, 1999.
M. Baeva, A. Beskrovni, S. Danilkin, H. Fuess, E. Jadrowski, T. Wieder:
X-Ray and Neutron Study of Crystal Structure and Lattice Dynamics of Fe-Cr-Mn-
and Fe-Cr-Ni-Nitrogen Steels with Different Mn and Cr Content;
Deutsche Neutronenstreutagung, 25-27 May, 1999, Potsdam, Germany, Abstracts, p. 174.
T. Wieder:
Anwendung der generalisierten Debyeschen Streuformel
auf die Strukturbestimmung von amorphem SiO2;
6. Jahrestagung der Deutschen Gesellschaft für Kristallographie, Karlsruhe, 1998,
Zeitschrift für Kristallographie, Supplement (1998), ISBN 3-486-64262-6.
S. Danilkin, H. Fuess, T. Wieder, H. Wipf , E. Yadrowski:
Interstitial Atom Effect on the Structure and Lattice Dynamics of Nb and Fe-based Alloys;
Proceedings of the German-Russian User Meeting, Condensed Matter Physics with Neutrons at IBR-2,
Frank Laboratory of Neutron Physics, Dubna, Russia, April 2-4, 1998, p. 111 - 116.
S. Danilkin, H. Fuess, E. Jadrowski, T. Wieder, H. Wipf:
X-Ray and Neutron Scattering Study of the Niobium-Oxygen Solid Solutions;
The Seventeenth International Conference on Applied Crystallography, August 31 – September 4, 1997, Wilsa-Jawornik, Poland.
S. Danilkin, H. Fuess, E. Jadrowski, T. Wieder, H. Wipf:
Crystal Structure and Lattice Dynamics of Niobium-Oxygen Solid Solutions;
Proceedings of the National Conference for Application of the X-ray, Synchrotron Radiation, Neutrons and Electrons in the Materials Science,
RSNE’97, Moscow-Dubna 25-29 May 1997, Russia, vol 3, p. 15 - 18.
T. Wieder, H. Fuess:
On the generalized Debye scattering equation;
Konferenzbericht European Powder Diffraction (EPDIC) 5, Parma, 1997,
Materials Science Forum 278-281 (1998), p. 100 - 105,
ISSN 0255-5476 (Trans. Tech. Publications, Schweiz),
Part 1 als Buch: ISBN 0-87849-808-7.
doi: 10.4028/www.scientific.net/MSF.278-281.100
T. Wieder, H. Fuess:
A generalized Debye scattering formula;
5. Jahrestagung der Deutschen Gesellschaft für Kristallographie, Hamburg, 1997;
Zeitschrift für Kristallographie, Supplement No. 12, (1997), S. 208, ISBN 3-486-64256-1.
T. Wieder, H. Fuess:
Gitterkonstantenbestimmung an dünnen Schichten;
4. Jahrestagung der Deutschen Gesellschaft für Kristallographie, Marburg, 1996,
Zeitschrift für Kristallographie, Supplement No. 11, (1996), S. 135, ISBN 3-486-64253-7
T. Wieder, J. Zendehroud:
Thermal Strains In Thin Films And Grazing Incidence X-Ray Diffraction;
European Crystallographic Meeting ECM 15, Dresden, 1994.
B. Dorn, M. Schwörer, T. Wieder, I. Munder:
Mechanical and Analytical Characterization of TiAlCN-films;
VI-th Israel Materials Science Conference, Dead Sea, 1993.
Rosa Santa, Thomas Wieder, Herwig Bangert, Alfred Wagendristel:
Stress and Grain Size Determination in Cu-Pb Sputtered Thin Films;
3rd European Vacuum Conference, EVC-3, Wien, 1991,
Pergamon Press, Oxford, 1992.
H. Gärtner, K. Thoma, H. Volkmann, Th. Wieder, A. Schmitt, D.M. Rück, B.H. Wolf:
High-Energy Implantation of Kr+ into Ti;
15th International Conference on Particle Tracks in Solids, Marburg, 3 - 7 September 1990,
Pergamon Press, Oxford, 1990, ISSN 0191-278x.
International Journal of Radiation Applications and Instrumentation. Part D. Nuclear Tracks and Radiation Measurements 19 (1991), 885 - 890.
doi: 10.1016/1359-0189(91)90334-E
W. Siejkowsi, T. Wieder, and H. Gärtner:
X-Ray Diffraction on oxidized and sulfidized Magnetron-sputtered thin Nickel films;
Powder Diffraction, Satellite Meeting of the XVth Congress of the International Union of Crystallography, Bordeaux, 1990.
Th. Wieder, K. Thoma, H. Gärtner:
Ion Implantation into metals at very high energies;
Proceedings of the Workshop on Experiments and Experimental Facilities at SIS/ESR, Darmstadt, March 30 – April 1, 1987,
GSI Report GSI-87-7, ISSN 0171-4546.
R. Färber, K. Thoma, T. Wieder und H. Gärtner:
Ionenplattierte Nickelschichten auf Stahl;
PVD '86, Internationale Tagung 11./12. März 1986 in Darmstadt, S. 309 - 324.
Annual Reports:
A. N. Skomorokhov, V. A. Semenov, A. Hohl, T. Wieder:
Experimental report on INS measurements on amorphous SiO performed using the DIN-2PI spectrometer;
Frank Laboratory of Neutron Physics, Joint Institute for Nuclear Research (JINR), Dubna, Russia, 2003.
A. Hohl, T. Wieder, H. Fuess, A. Njeh, A. Zimina, S. Eisebitt:
Resonant inelastic X-ray scattering on amorphous silicon monoxide (SiO);
BESSY Jahresbericht 2003, Berlin, 2003.
A. Hohl, T. Wieder, V. Joco, H. Fuess, S. Gottschalk, A. Volland, M. Ghafari, M. Fieber-Erdmann:
EXAFS spectroscopy of amorphous iron-scandium alloys Fe100-xScx;
BESSY Jahresbericht 2002, Berlin, 2002.
A. Hohl, T. Wieder, V. Joco, H. Fuess, M. Fieber-Erdmann, and F. Schäfers:
Si K-edge NEXAFS spectroscopy of amorphous silicon monoxide (SiO);
BESSY Jahresbericht 2002, Berlin, 2002.
T. Wieder, A. Hohl, M. A. Gonzalez:
The Structure of Amorphous Siliconmonoxide SiO;
ILL Annual Report 1999.
S. Danilkin, T. Wieder, H. A. Graff, A. Hoser:
Phonon dispersion in Fe-Cr-Mn(Ni) austenitic steel;
HMI Jahresbericht 1999, Hahn-Meitner-Institut, Berlin, 1999, p. 147 .
A. Hohl, T. Wieder, M. Ghafari, B. Stahl, M. Winterer, M. Tischer:
Short Range Order in Fe(100-x)Sc(x) from EXAFS spectra;
HASYLAB Annual Report 1999,
HASYLAB, Hamburg, 1999.
A. Hohl, T. Wieder, M. Knapp:
Radial Distribution Function of Silicon Monoxide (SiO);
HASYLAB Annual Report 1999,
HASYLAB, Hamburg, 1999.
C. Wahl, T. Wieder, M. Knapp:
Residual stresses in an interpenetrating W/Cu composite;
HASYLAB Annual Report 1998,
HASYLAB, Hamburg, 1998.
D. Zheng, T. Wieder, K. Haberle, M. Knapp:
Rietveld refinement of amorphous SiO2;
HASYLAB Annual Report 1998,
HASYLAB, Hamburg, 1998.
H. Wipf, S. Danilkin, E. Jadrowski. H. Fuess, T. Wieder:
X-ray and neutron scattering study of the Nb-O-solid solutions;
Frank Laboratory of Neutron Physics of the Joint Institute for Nuclear Research (JINR), Dubna, Russia, 1998.
D. Zheng, T. Wieder, B. Breidenstein, H. Fuess:
Rietveld refinement of amorphous SiO2;
Euroseminar Integrated Analysis of Defect Structures in Crystalline Materials,
Freiberg/Sa., November 23 - 27, 1998, Technische Universität, Bergakademie;
T. Wieder, T. Priling, A. Neubrand, H. Fuess:
Residual Stress Measurement in a Gradient Material;
ILL Annual Report 1997,
ILL, Grenoble, 1997.
W. D. Kaplan and G. Kimmel, T. Wieder, K. Thoma and H. Gärtner:
Ion Implantation of MoNi and La-Ga Alloys;
GSI Scientific Report 1990, Gesellschaft für Schwerionenforschung,
Darmstadt 1991, p. 238, ISSN 0174-0814.
T. Wieder, K. Thoma and H. Gärtner:
Surface strains in polycrystalline metals induced by deep ion implantation;
GSI Scientific Report 1988, Gesellschaft für Schwerionenforschung,
Darmstadt 1989, p. 239, ISSN 0174-0814.
T. Wieder, W. Herr and H. Gärtner:
Calculation of the influence of a nitrogen concentration gradient on
the results of X-ray residual stress measurements;
GSI Scientific Report 1988, Gesellschaft für Schwerionenforschung,
Darmstadt 1989, 238, ISSN 0174-0814.
T. Wieder, K. Thoma and H. Gärtner:
Implantation of Cs ++ into Ti;
GSI Scientific Report 1987, Gesellschaft für Schwerionenforschung,
Darmstadt 1988, p. 266, ISSN 0174-0814.
T. Wieder, K. Thoma and H. Gärtner:
Depth Resolving X-ray Analysis of Ion Implanted Metal Surfaces;
GSI Scientific Report 1987, Gesellschaft für Schwerionenforschung,
Darmstadt 1988, p. 267, ISSN 0174-0814.
T. Wieder, K. Thoma and H. Gärtner:
X-ray analysis of Cs implanted into Ti;
GSI Scientific Report 1986, Gesellschaft für Schwerionenforschung,
Darmstadt 1987, p. 247, ISSN 0174-0814.
Technische Berichte
T. Wieder:
Explicit expressions for d-dimensional spherical surface harmonics by the program SSHY
2009.
Meine Programme
Mathematik / Mathematics
1. MULTISELECTION
MULTISELECTION generates multiselections from multisets.
Maple worksheet Multiselection.mw Maple program Multiselection.mpl
Thomas Wieder: Generation of all possible multiselections from a multiset,
2. ENUM
ENUM generates contingency tables with given shape and row and column sums.
Maple worksheet enum.mw Maple program enum.mpl
3. MULTICHOOSE and MULTISUBSET
Generate multiselections from multisets.
Maple worksheet for program multichoose.mw Maple program multichoose.mpl http://www.maplesoft.com/applications/ http://www.maplesoft.com/email/maplereporter/apr10/
Maple worksheet multisubset.mw Maple program multisubset
4. HANKEL
Evaluate the Hankel transform (Fortran).
Evaluate the Hankel transform (Fortran).
T. Wieder: Numerical Hankel transform by the Fortran program HANKEL;
Transactions on Mathematical Software (TOMS) 25 (1999), 240 - 250.
5. OPTM0
Selection of optimal submultisets from a multiset.
OPTM0.pdf OPTM0.f95 simulated_anneal.f95 LIMITS.f95 AUXILIARY.f95 OPTM0.in OPTM0.out
6. MULTISELECTION_FROM_MULTISET
Yet another Maple program for multiselections from multisets (one after the other):
Multiselection (2nd approach) next_ordered_fixed_length_partition.mpl Multiselection_From_Multiset.mw
Röntgenbeugung / X-Ray Diffraction:
1. DMRM
Two-dimensional deconvolution by Siska's method (Fortran).
2. GDSF
Evaluate the Generalized Debye Scattering Formula (Fortran).
T. Wieder: A generalized Debye scattering formula and the Hankel transform;
Zeitschrift für Naturforschung 54a (1999), 124 - 130.
3. SBGBBG
X-ray Residual Stress Determination (Fortran).
SBGBBG SBGBB (Crystallography source code museum)
4. WVM
Lattice Constants in Thin Films (Fortran). WVM
T. Wieder: WVM: A computer program for the determination of lattice parameters and strains in thin films;
Computer Physics Communications 96 (1996), 53 - 60.
Materialia
1. Maple programs for the calculation (based on integer partitions) of some integer sequences of the OEIS.
Maple program MapleProgramsForSomeIntegerSequences.mpl
2. Some very basic combinatorial subroutines written in VBA for Excel.
VBA programs calculation of Binomial coefficients, Stirling numbers, Bell numbers, etc.
3. Some very basic combinatorial subroutines written for Maple (presently only very few...).
4. A Maple program to calculate the number of k-combinations from a multiset according to MacMahon's formula.
Maple program MacMahonsMultisetFormula.mpl Maple program Number_of_k_Combinations.mpl
5. Calculate the n-dimensional Surface Spherical Harmonics according to the definition by Harry Bateman.
Maple worksheet SSHY.mw Maple program Y.mpl Y.pdf http://www.maplesoft.com/email/maplereporter/July09/
Weitere Seiten
https://www.researchgate.net/profile/Thomas_Wieder/
https://oeis.org/wiki/User:Thomas_Wieder
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Begonnen: 1997
Letzte Änderung: 17.4.2024