Published Books: R.F. Egerton, Physical Principles of Electron Microscopy, 2nd edition
(Springer, 2016) ISBN 978-3-319-39876-1 ; ISBN 978-3-319-39877-8 (eBook); DOI 10.1007/978-3-319-39877-8
R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition
(Springer, 2011) ISBN 978-1-4419-9582-7 , e-ISBN 978-1-4419-9583-4 , DOI 10.1007/978-1-4419-9583-4
Selected Articles: Hui Qian and Ray F. Egerton, Solid-state nanopores of controlled geometry fabricated in a transmission electron microscope, Appl. Phys. Lett. 111 (2017) 193106.R.F. Egerton, Calculation, consequences and measurement of the point spread function for low-loss inelastic scattering, Microscopy (2018) i52-i59, doi: 10.1093/jmicro/dfx089 (Oxford University Press).R.F. Egerton, Scattering delocalization and radiation damage in STEM-EELS, Ultramicroscopy 180 (2017) 115-124.R.F. Egerton, Outrun radiation damage with electrons? Advanced Structural and Chemical Imaging 1 (2015) 5 , doi:10.1186/s40679-014-0001-3 , www.ascimaging.com/content/1/1/5.
R.F. Egerton, Vibrational-loss EELS and the avoidance of radiation damage, Ultramicroscopy 159 (2015) 95-100. R.F. Egerton, T. Konstantinova and Y. Zhu, Analysis of Beam-Sensitive Materials by Electrons and X-rays Advances in Imaging and Electron Physics (Elsevier), ed. M Berz, PM Duxbury and C-Y Ruan, vol. 191 (2015) 70 - 80.R.F. Egerton, Prospects for Vibrational-Mode EELS with High Spatial Resolution Microscopy & Microanalysis 20 (2014) 658 - 663.R.F. Egerton, Choice of operating voltage for a transmission electron microscope Ultramicroscopy 145 (2014) 85 - 93.Ray Egerton, A Modest Proposal for the Propagation of Information Concerning Radiation Damage in the TEM,
and as Fodder for Pasturized Professors. Microscopy Today November (2013) 10 - 11.R.F. Egerton, Beam-induced motion of adatoms in the TEM. Microscopy & Microanalysis 19 (2013) 479 - 486.R.F. Egerton, Control of radiation damage in the TEM. Ultramicroscopy 127 (2013) 100-108.R.F. Egerton, Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV. Microscopy Research & Technique 75 (2012) 1550-1556.R.F. Egerton, S. Lazar and M. Libera, Delocalized radiation damage in polymers. Micron 43 (2012) 2-7.R.F. Egerton, Electron energy-loss spectroscopy in the TEM. Rep. Prog. Phys. 72 (2009) 016502 (25pp).R.F. Egerton, F. Wang, M. Malac, M.S. Moreno and F. Hofer Fourier-ratio deconvolution and its Bayesian equivalent. Micron 39 (2008) 642-647.R.F. Egerton, Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy. Ultramicroscopy 107 (2007) 575-586.Ray F. Egerton, Feng Wang and Peter A. Crozier, Beam-induced damage to thin specimens in an intense electron probe. Microscopy and Microanalysis 12 (2006) 65-71.R.F. Egerton, Hui Qian and Marek Malac, Improving the energy resolution of x-ray and electron energy-loss spectra. Micron 37 (2006) 310-315.R.F. Egerton, P. Li and M. Malac, Radiation damage in the TEM and SEM. Micron 35 (2004) 399-409.R.F. Egerton, New techniques in electron energy-loss spectroscopy. Micron 34 (2003) 127-129. |
 Updating... Ċ TEM EELS, Aug 15, 2016, 3:21 PM ĉ TEM EELS, Aug 15, 2016, 3:16 PM Ċ TEM EELS, Aug 15, 2016, 3:16 PM
|