Ray Egerton‎ > ‎

Publications


Published Books:

R.F. EgertonPhysical Principles of Electron Microscopy, 2nd edition 
(Springer, 2016; ISBN 978-3-319-39876-1 ; ISBN 978-3-319-39877-8 (eBook); DOI 10.1007/978-3-319-39877-8)

R.F. EgertonElectron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition
(Springer, 2011) ISBN 978-1-4419-9582-7 , e-ISBN 978-1-4419-9583-4 , DOI 10.1007/978-1-4419-9583-4.


Selected Publications (Articles):
For a more complete list, see egerton_publications.pdf

R.F. Egerton, Calculation, consequences and measurement of the point spread function for low-loss inelastic scattering, submitted to Microscopy (EDGE-2017 special issue).

R.F. Egerton Scattering delocalization and radiation damage in STEM-EELSUltramicroscopy 180 (2017) 115-124.

R.F. Egerton Outrun radiation damage with electrons? Advanced Structural and Chemical Imaging 1 (2015) 5 , doi:10.1186/s40679-014-0001-3 , www.ascimaging.com/content/1/1/5.

R.F. Egerton, T. Konstantinova and Y. Zhu Analysis of Beam-Sensitive Materials by Electrons and X-rays Advances in Imaging and Electron Physics (Elsevier), ed. M Berz, PM Duxbury and C-Y Ruan, vol. 191 (2015) 70 - 80.

R.F. Egerton Prospects for Vibrational-Mode EELS with High Spatial Resolution Microscopy & Microanalysis 20 (2014) 658 - 663.

R.F. Egerton Choice of operating voltage for a transmission electron microscope Ultramicroscopy 145 (2014) 85 - 93.

Ray Egerton A Modest Proposal for the Propagation of Information Concerning Radiation Damage in the TEM, 
and as Fodder for Pasturized Professors 
Microscopy Today November (2013) 10 - 11.

R.F. Egerton Beam-induced motion of adatoms in the TEM. Microscopy & Microanalysis 19 (2013) 479 - 486..

R.F. Egerton Control of radiation damage in the TEM. Ultramicroscopy 127 (2013) 100-108..

R.F. Egerton Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV. Microscopy Research & Technique 75 (2012) 1550-1556..

R.F. Egerton, S. Lazar and M. LiberaDelocalized radiation damage in polymers. Micron 43 (2012) 2-7..

R.F. EgertonElectron energy-loss spectroscopy in the TEM. Rep. Prog. Phys. 72 (2009) 016502 (25pp).

R.F. Egerton, F. Wang, M. Malac, M.S. Moreno and F. Hofer Fourier-ratio deconvolution and its Bayesian equivalent. Micron 39 (2008) 642-647

R.F. EgertonLimits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy. Ultramicroscopy 107 (2007) 575-586

Ray F. EgertonFeng Wang and Peter A. CrozierBeam-induced damage to thin specimens in an intense electron probe. Microscopy and Microanalysis 12 (2006) 65-71.

R.F. EgertonHui Qian and Marek MalacImproving the energy resolution of x-ray and electron energy-loss spectra. Micron 37 (2006) 310-315.

R.F. Egerton, P. Li and M. MalacRadiation damage in the TEM and SEM. Micron 35 (2004) 399-409

R.F. EgertonNew techniques in electron energy-loss spectroscopy. Micron 34 (2003) 127-129

Subpages (1): Downloadable Articles
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TEM EELS,
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TEM EELS,
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TEM EELS,
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