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NiOx Test Specimen

This specimen was developed for making quantitative measurements of stray radiation in a TEM column ("hole counts") but can also be used as an informal standard for EELS and camera-length determination, as described in the application notes.

Although no longer made at the University of Alberta, it is available from commercial electron-microscope vendors.

SelectionFile type iconFile nameDescriptionSizeRevisionTimeUser
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Round-robin test (1995)  4254k v. 1 Jul 6, 2016, 2:57 PM TEM EELS
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Ultramicroscopy (1994) description  1103k v. 1 Jul 6, 2016, 2:53 PM TEM EELS
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Application Notes  164k v. 1 Jul 6, 2016, 2:53 PM TEM EELS
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Lehigh University (2010) implementation  181k v. 1 Jul 6, 2016, 2:56 PM TEM EELS
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Microscopy & Microanalysis (2011) abstract   707k v. 1 Jul 6, 2016, 2:56 PM TEM EELS
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Microscopy & Microanalysis (1995) abstract  126k v. 1 Jul 6, 2016, 2:53 PM TEM EELS