qAim & Scope
Secondary Ion Mass Spectrometry (SIMS) has been playing an increasingly important role in the isotope analysis of extraterrestrial, geological, and environmental samples. NanoSIMS, a special kind of SIMS with extremely high spatial resolution (~ 50 nm), allows for studies of natural and synthetic samples at submicron scales. In this workshop, we invite three world experts on SIMS analysis to share their experience, and then discuss some scientific ideas that could be performed on the future NanoSIMS facility at Academia Sinica.
vSachiko Amari: Research Prof. at the Dept. of Physics, Washington Univ. at St. Louis. An expert on isotopic studies of presolar grains using SIMS.
vCiska Kemper: Associate Research fellow at Inst. of Astro. and Astrophys, Academia Sinica. An astronomer who specializes on astronomical observation of interstellar dust.
vLarry Nittler: Staff Scientist at the Dept. of Terrestrial Magnetism, Carnegie Inst. of Washington. An expert on isotopic studies of presolar grains and extraterrestrial organic matter using SIMS.
vHisayoshi Yurimoto: Professor at the Dept. of Natural History Sciences, Hokkaido Univ. He has more than 25 years of experience with isotopic analysis of geological and meteoritic material with SIMS
qTime: Jan 18 - 19, 2011
qVenue: 6F seminar room, Institute of Earth Sciences, Academia Sinica.
Attendance limited (max 50 persons).
Please register by email: anita at earth.sinica.edu.tw (02-27839910 ext 613)
For any question regarding the workshop, please email: mcliu at asiaa.sinica.edu.tw
Organizing committee: Typhoon Lee, Der-Chuen Lee, Ming-Chang Liu, Anita Wu.
Workshop sponsored by: ASIAA, ASIES and ASRCEC