Last Update: Oct 25, 2016
See updated and full publication list on: http://scholar.google.com
D. Ziegler, T.R. Meyer, A. Amrein, A. Bertozzi, P.D. Ashby. Ideal Scan Path for High-Speed Atomic Force Microscopy, IEEE/ASME Transactions on Mechatronics 2016. DOI:10.1109/TMECH.2016.2615327
S.Y. Leblebici, L. Leppert, Y. Li, S.E. Reyes-Lillo, S. Wickenburg, E. Wong, J. Lee, M. Melli, D. Ziegler, D.K. Angell, D.F. Ogletree, P.D. Ashby, F.M. Toma, J.B Neaton, I.D. Sharp, A.Weber-Bargioni. Facet-dependent photovoltaic efficiency variations in single grains of hybrid halide perovskite, Nature Energy 1, Article number: 16093 (2016) DOI:10.1038/nenergy.2016.93
P. Kulshreshtha, K. Maruyama, S. Dhuey, D. Ziegler, W. Chao, P. Ashby and D. Olynick, Revealing beam-induced chemistry using modulus mapping in negative-tone EUV/e-beam resists with and without cross-linker additives, Proc. SPIE 9425, Advances in Patterning Materials and Processes XXXII, 94250I, 2015. DOI: 10.1117/12.2086045
D. Ziegler, A. Klaassen, D. Bahri, D. Chmielewski, A. Nievergelt, F. Mugele, J. Sader, and P.D. Ashby, Encased cantilevers for Low-Noise Force and Mass Sensing in Liquids. IEEE MEMS2014, p128-131, 2014. DOI:10.1109/MEMSYS.2014.6765590
T. R. Meyer, D. Ziegler, Ch. Brune, A. Chen, R. Farnham, N. Huynh, J-M. Chang, A. Bertozzi, P.D. Ashby, Height Drift Correction in Non-Raster Atomic Force Microscopy, Ultramicroscopy, 137(0), 48–54, 2014. DOI:10.1016/j.ultramic.2013.10.014
Y. Zhang, D. Ziegler, M. Salmeron, Charge Trapping States at the SiO2-Oligothiophene Monolayer Interface in Field Effect Transistors Studied by Kelvin Probe Force Microscopy, ACS Nano, 7 (9), 8258, 2013. DOI:10.1021/nn403750h
D. Ziegler, T. Meyer, R. Farnham, Ch. Brune, A. L. Bertozzi and P. Ashby, Improved accuracy and speed in scanning probe microscopy by image reconstruction from non-gridded position sensor data, Nanotechnology, 24, 335703, 2013. DOI:10.1088/0957-4484/24/33/335703
P. K. Kulshreshtha, K. Maruyama, S. Kiani, D. Ziegler, J. Blackwell, D. Olynick, P. Ashby, Nanoscale modulus and surface chemistry characterization for collapse free resists, Proc. SPIE, 8681, Metrology, Inspection, and Process Control for Microlithography XXVII, 86810O, April 18, 2013. DOI:10.1117/12.2011657
D. Ziegler, A. Nievergelt, A. Benard, T. Meyer, C. Brune, Y. Lou, A. Bertozzi, P. Ashby, Spiral Scanning and Encased Cantilevers for High Spatial and Temporal Resolution in Atomic Force Microscopy, Biophys J, Abstract, 104, 512, 2013. DOI:10.1016/j.bpj.2012.11.2828
P.D. Ashby, D. Ziegler, A. Frank, S. Frank, Chen, T. Meyer, R. Farnham, Huynh, I. Rangelow, Chang, A. Bertozzi, Encased Cantilevers and Alternative Scan Algorithms for Ultra-Gentle High Speed Atomic Force Microscopy, Biophys J, Abstract, 102(3):0, 2012. DOI:10.1016/j.bpj.2011.11.3193
D. Ziegler, P. D. Ashby, Encased Cantilevers for Ultra-Low-Noise Force Spectroscopy of Proteins and Ligand Receptor Complexes, Biophys J, Abstract, 102 (3), 579a, 2012. DOI:10.1016/j.bpj.2011.11.3151
D. Ziegler, P. Gava, J. Güttinger, F. Molitor, L. Wirtz, M. Lazzeri, A. M. Saitta, A. Stemmer, F. Mauri, C. Stampfer, Work function fluctuations in Doped Single- and Few-layer Graphene, Phys. Rev. B, 83, 235434, 2011. DOI:10.1103/PhysRevB.83.235434
D. Ziegler, and A. Stemmer, Force gradient sensitive detection in lift-mode Kelvin probe force microscopy, Nanotechnology, 22, 075501, 2011. DOI:10.1088/0957-4484/22/7/075501
R. Enning, D. Ziegler, A. Nievergelt, R. Friedlos, K. Venkataramani, and A. Stemmer, A high frequency sensor for optical beam deflection atomic force microscopy. Review of Scientific Instruments, 82(4), 043705, 2011. DOI:10.1063/1.3575322
F. M. Koehler, N. A. Luechinger, D. Ziegler, E. K. Athanassiou, R. N. Grass, A. Rossi, C. Hierold, A. Stemmer, and W. J. Stark, Permanent Pattern-Resolved Adjustment of the Surface Potential of Graphene-like Carbon through Chemical Functionalization, Angew. Chem. Int. Ed., 48, 224-227, 2009. DOI:10.1002/anie.200804485
A. Stemmer, D. Ziegler, L. Seemann et al., Electric charges and forces in atomic force microscopy and nano-xerography, J. Phys.: Conf. Ser., 142 012048, 2009. DOI:10.1088/1742-6596/142/1/012048
D. Ziegler, N. Naujoks, and A. Stemmer, Feed-forward Compensation of Surface Potential in Atomic Force Microscopy, Rev. Sci. Instr. 79, 063704, 2008. DOI:10.1063/1.2947740
D. Ziegler, J. Rychen, N. Naujoks, and A. Stemmer, Compensating Electrostatic Forces by Single-scan Kelvin Probe Force Microscopy, Nanotechnology,18, 225505, 2007. DOI:10.1088/0957-4484/18/22/225505
D. Ziegler, T. Suzuki, and S. Takeuchi, Fabrication of Flexible Neural Probes with Built-In Microfluidic Channels by Thermal Bonding of Parylene, J. MEMS, Vol. 15, (6), 1477, 2006. DOI:10.1109/JMEMS.2006.879681
D. Ziegler, P. Coquet, A. Tixier-Mita, G. Tresset, H. Fujita, and S. Takeuchi, Microfluidic Device for Immobilization of Bio-vesicles towards controlled On-chip Electrofusion, Solid-State Sensors, Actuators and Microsystems, Vol. 1, 360, 2005. DOI:10.1109/SENSOR.2005.1496430
S. Takeuchi, D. Ziegler, Y. Yoshida, K. Mabuchi, and T. Suzuki, Parylene flexible neural probes integrated with microfluidic channels, Lab Chip, 5(5), 519-23. 2005. DOI:10.1039/b417497f
S. Takeuchi, Y. Yoshida, D. Ziegler, K. Mabuchi, T. Suzuki, Parylene flexible neural probe with micro fluidic channel, Micro Electro Mechanical Systems, 2004. 17th IEEE International Conference, 2004. DOI:10.1109/MEMS.2004.1290559
T. Suzuki, D. Ziegler, K. Mabuchi, S. Takeuchi, Flexible neural probes with micro-fluidic channels for stable interface with the nervous system, Engineering in Medicine and Biology Society, 2004. IEMBS'04. 26th Annual 26th Annual International Conference of the IEEE, 2004. DOI:10.1109/IEMBS.2004.1404132
D. Ziegler, P. Linderholm, M. Mazza, S. Ferazzutti, D. Bertrand, A. M. Ionescu, and Ph. Renaud, An active Microphotodiode Array of Oscillating Pixels for Retinal Stimulation, Sensors and Actuators A: Physical, Vol. 110, 11-17, 2004. DOI:10.1016/j.sna.2003.09.040
D. Ziegler, S. Ferazzutti, D. Bertrand, A. M. Ionescu, Ph. Renaud, “An Oscillating Active Pixel for Subretinal Stimulation”, Proceedings of Eurosensors XVI, 2002 Prague, September 15-18. 2002.
Patents:
D. Ziegler, P. Ashby, Sensor for low force noise detection in liquids. Publication date: 2013/03/14. PCT/US2012/051764. http://patentscope.wipo.int/search/en/WO2013036377
D. Ziegler, J. Rychen, and A. Stemmer, Scanning Probe Microscope and Method for operating the same. Publication date: 2008/17/1. PCT/CH2006/000371. http://www.wipo.int/pctdb/en/wo.jsp?wo=2008006229
Last Update: Oct 25, 2016