Presentations

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SELECTED PRESENTATIONS AND POSTERS 


QSIP 2016 - Quantum Structure Infrared Photodetectors Conference, Tel Aviv, Israel (June 2016)

Roodenko K.,  Choi K.-K.,  Clark  K. P.,  Fraser E. D.,  Vargason K. W.,  Kuo J.-M.,  Kao Y.-C.,  Pinsukanjana P. R.

Talk (1): "Control over the optical and electronic performance of GaAs/AlGaAs QWIPs grown by molecular beam epitaxy"

and

Roodenko K., Liao  P.-K., Lan D., Clark K. P., Fraser E. D.,  Vargason K. W.,  Kuo J.-M.,  Kao Y.-C., Pinsukanjana P. R.

Talk (2): "Development of n-type Te-doped GaSb substrates with low carrier concentration for FPA applications"


SPIE-OPO 2016- San Diego, CA, USA  (Aug. 2016)

Roodenko K.,  Choi K.-K.,  Clark  K. P.,  Fraser E. D.,  Vargason K. W.,  Kuo J.-M.,  Kao Y.-C.,  Pinsukanjana P. R.

Talk: “Control over dark current densities and cutoff wavelengths in GaAs/AlGaAs QWIP grown by multi-wafer MBE reactor ”

SPIE-DCS 2016- Baltimore, Maryland, USA  (April 2016)

Roodenko K.,  Choi K.-K.,  Clark  K. P.,  Fraser E. D.,  Vargason K. W.,  Kuo J.-M.,  Kao Y.-C.,  Pinsukanjana P. R

Poster: “Infrared optical and electronic properties in low tellurium doped GaSb substrates for SLS FPA applications

ICSE-V 2010 - 5th International Conference on Spectroscopic Ellipsometry, Albany, NY, USA (23.05 - 28.05.2010)

Roodenko K., Seitz O., Park S. K., Chabal Y. J.

Talk: “Optical simulations of infrared spectra: retrieving information on structure, orientation and conductivity of thin films”

ESIS 2006 - The new European Seminar on Infrared Spectroscopy, Lyon Villeurbanne, France  (4.04-6.04.2006)

Roodenko K., Gensch M., Rappich J., Hunger R., Esser N., Hinrichs K.

Talk: “Infrared ellipsometric studies of electrochemically grafted thin organic layers”

 

DPG Fruehjahrstagung in Dresden (26.03-31.03.2006)

 

Roodenko K., Rappich J., Hunger R., Gensch M., Guell A.G., Dittrich Th., Merson A., Shapira Y., Esser N.,  Hinrichs K.

Poster: “Application of infrared spectroscopic ellipsometry in studies of electrochemically grafted thin organic monolayers”

 

Sindu J. L., Lehmann D., Roodenko K., Hinrichs K., Esser N., Friedrich M., Zahn D. R. T.

Talk: “Molecular orientation of ZnPc grown on silicon(111) substrates and its influence on the optical constants”

 

4th Workshop Ellipsometry, Berlin, Germany (20.02.06-22.02.2006)

 

Roodenko K., Rappich J., Hunger R., Guell A.G., Gensch M., Dittrich Th., Merson A., Shapira Y., Esser N.,  Hinrichs K.

Talk: “Investigation of electrochemically grafted organic thin films by infrared spectroscopic ellipsometry”

 

WIRMS 2005 - International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, (26.06–30.06.2005)

 

Roodenko K., Gensch M., Heise M., Schade U., Esser N., Hinrichs K.

Poster: “Properties of Organic Films Investigated with High Spatial Resolution

Infrared Synchrotron Ellipsometry”

 

Gensch M., Hinrichs K., Roodenko K., Schade U., Roeseler A., Korte E. H. Esser N.

Poster: “Application of synchrotron infrared ellipsometry for analysis of

ultra thin organic films”

 

DPG Fruehjahrstagung in Berlin (04.03-09.03.2005)

Roodenko K., Gensch M., Rappich J., Schade U., Hunger R., Dittrich Th., Merson A., Shapira Y., Esser N., Hinrichs K.

Talk: “Infrared ellipsometric study of electrochemically grafted organic layers on TiO2 and Si”,

 

Hinrichs K., Gensch M., Roodenko K., Esser N.

Talk: “Infrared ellipsometry for structure analysis of organic films”

 

Gensch M., Roodenko K., Schade U., Rצseler A., Hinrichs K. Esser N.

Poster: “Applications of Synchrotron Infrared ellipsometry for analysis of

small samples and heterogeneous films”