Presentations

2016 Presentations

 Presenter Affiliation Title Presentation
 Eric Crabill
XilinxAn Introduction to Single Event Effects PDF
 Adrian Evans
iROCSystem Level Impacts of Soft Errors PDF
 Rick Wong  
Cisco Systems
Challenges of Alpha Testing PDF
Stuart Coleman
Brendan McNally
Michael Gordon
XIA LLC
IBM
Techniques and Challenges of Alpha Emissivity Measurements PDF
Laura Monroe  
Los Alamos National Lab
Resilience and Inexact Computing PDF
Helmut Puchner
Francis Glasse
Cypress Semiconductor
Soft Error Upset Sensitivity to the Array Background Pattern in SLC Floating Gate and Charge Trapping Flash Memories PDF
 Eric Crabill
 XilinxAlpha-Induced Soft Errors in Xilinx UltraScale+ Devices – Not a ‘Material’ Issue PDF

2015 Presentations

 Presenter  Affiliation  Title  Presentation

Pierre Maillard

Xilinx
Neutron, 64 MeV proton, Thermal Neutron and Alpha Single-Event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA
PDF

Durwyn Dsilva

Microsemi

SEL and SEU Performance of Microsemi SmartFusion2 FPGAs

PDF
Mike Gordon
IBM

Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
PDF
Bharat Bhuva  
Vanderbilt University

Single-event Error Rates of D Flip-flops in 20-nm planar and 16-nm FinFET Bulk CMOS Technology

PDF

Norbert Seifert

Intel
Single Event Effects in the FinFET Era PDF
Charlie Slayman
Cisco Systems

Updates on JEDEC JESD89 Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices

PDF
Paolo RechFederal University of Rio Grande do Sul (UFRGS)The Reliability Issue in Actual and Future Supercomputers
PDF
Paolo Privitera University of Chicago

High resistivity, Thick CCDs for Ultra-Low Alpha Emissivity Measurements

PDF


2014 Presentations and WebEx Replay

 Presenter  Affiliation  Title  Presentation

Yi-pin Fang

TSMC

Cell Level Soft Error Rate Simulations on Planar and FinFET Processes

PDF
WebEx Replay

Philippe Roche

STMicroelectronics

Latest 3D-TCAD simulations and radiation test results in UTBB FDSOI 28nm

PDF
WebEx Replay
Helmut Puchner Cypress Semiconductor

Alpha Emission Qualification of a 361pin Flip-Chip Package utilizing System Soft Error Testing
PDF
WebEx Replay
Steve KevanLawrence Berkeley National Laboratory

Keynote: Soft X-ray Science and Future Generation Computing

PDF
WebEx RePlay

Nathan DeBardeleben

Los Alamos National Laboratory
Supercomputer Field Data - DRAM, SRAM, and Projections for Future Systems PDF
WebEx Replay
Jehoda Refaeli
Freescale Semiconductor

Accounting for Soft Errors with Functional Safety

PDF
WebEx Replay
Mike GordonIBM TJ Watson Research Center
The Need for an Industry-Wide, Large-Area, Ultra-Low Emissivity StandardPDF
WebEx Replay
Charlie Slayman
Cisco Systems

Status of JEDEC Task Group on Revision of JESD89A “Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices”

PDF
Webex Replay

Brett Clark

Honeywell

Characterization and Mitigation of Ambient Radon and Cosmogenic Influence on Alpha Emissivity Measurements

PDF
WebEx Replay
Jerry Cohn
Pure Technologies
Alpha Measurement and Control from a Supplier PerspectivePDF
WebEx Replay
Panel Discussion
All Speakers
Current State of Soft Error Mitigation and Future Technological NeedsWebEx Replay


2013 Presentations and WebEx Replay

 Presenter  Affiliation  Title  Presentation

Dinesh Maheshwari

Cypress Semiconductor

ECC Implementation to Reduce Accumulation of Memory Errors  and Interface Channel Errors

PDF
WebEx Replay

Adrian Evans

iROC

Techniques for Estimating the Effect of Combinatorial SER at the Chip Level

PDF
WebEx Replay
Blas Cabrera
Stanford University

Keynote

Radon Induced Backgrounds in Search for Dark Matter WIMPs with Ge Detectors

PDF
WebEx Replay
Mike Gordon
IBM

The Response of an XIA UltraLo-1800 Alpha Particle Counter to an External Beam of Protons

PDF
WebEx RePlay

Ramya Ramarapu

Cisco Systems

A Study of Temperature Induced Polonium Diffusion on SRAM SER Performance

PDF
WebEx Replay
Jeff Wilkinson
Medtronic

Follow-up Multicenter Alpha Counting Comparison

PDF
WebEx Replay

Helmut Puchner

Cypress Semiconductor

Soft Error Mitigated Programmable System-on-a-chip (PSoC)

PDF
WebEx Replay
Talk starts at ~30min of the recording

Bharat Bhuva

Vanderbilt University

FIT Rates due to Alpha Particles at 40, 28, and 20 nm Bulk CMOS Technology Nodes

PDF
WebEx Replay
Talk starts at ~60min of the recording


2012 Presentations and WebEx Replay

 Presenter  Affiliation  Title  Presentation
Nelson Tam
Marvell

Investigation on the Effects of Alpha Source Uniformity on the Estimation of Soft Error Rates in 28nm FF Memory

PDF
WebEx Replay
Robin Gardiner
Matheson Gas

A Materials Perspective on B10 Molecules for Advanced Si Technology Chips

PDF
WebEx Replay
Bharat Bhuva
Vanderbilt University

Combined SER of Bulk 28nm Technology from Logic and Flip Flops

PDF
WebEx Replay
Jeff WilkinsonMedtronic

Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing

PDF
WebEx RePlay
Brendan McNally
XIA

Preliminary Results from a Field Assessment of the UltraLo-1800

PDF
WebEx Replay
Mike Gordon
IBM

Alpha Testing - How Long is Enough?

PDF
WebEx Replay

Shah Jahinuzzaman

Intel

Alpha-particle Induced Soft Error Rates in 22nm Bulk Tri-Gate Technologies

PDF
WebEx Replay
Brett ClarkHoneywell

Distribution and Transport of Alpha Emitting Isotopes in Tin Packaging Materials

PDF
WebEx Replay
Yi-Pin Fang
TSMC

A Simple Method to Predict Cross-Technology Alpha SER and Thermal Neutron SER on Memory and Logic Devices

PDF
WebEx Replay
Sang H. Baeg


Hangyang University

High-Energy Alpha Particle SEU Measurements for Flip Chip Devices

PDF
WebEx Replay


2011 Presentations 

Download all of the presentations and replay the event via WebEx at CPMT SCV's website:

http://www.cpmt.org/scv/meetings/cpmt1110w.html


 Presenter  Affiliation  Title
Austin Lesea
Xilinx Soft-Error Architectural Vulnerability Factor for (Xilinx) FPGA Devices
Guillaume Warot
LSM
Alpha Emission Measurement by Gamma Ray Spectrometry
Helmut Puchner
Cypress Correlation of Life Testing to Accelerated Soft Error Testing
Michael Gordon
IBM On the Calibration of Alpha Sciences Proportional Counters
Nelson Tam
Marvell Investigation of Accelerated Alpha Testing with Vacuum
Bharat Bhuva
Vanderbilt University
Alpha-Particle-Induced Soft Error Rates for Flip-Flops Designed in a 28-nm Bulk CMOS Process
Gerry Maloney
Xilinx Flip-Chip Packaging Materials Alpha Characterization and Challenges
Robert Baumann  
 TIDetermining the Impact of Alpha-Particle-Emitting Contamination from the Fukushima-Daiichi Disaster on Japanese Semiconductor Manufacturing Sites
Brendan  Dwyer-McNally
 XIARecent Advancements in Next-Generation Alpha Counting Technology


2010 Presentations 

Download all of the presentations and replay the event via WebEx at CPMT SCV's website:

http://www.cpmt.org/scv/meetings/cpmt1010w.html

 Presenter  Affiliation  Title
Chiate Lin
Intersil Alpha Emission-Induced Router Failures: Diagnosis and Resolution
Prof. Bharat Bhuva Vanderbilt University
A Systematic and Collaborative Approach to Address SER Issues for Advanced Silicons
Rick Wong Cisco Systems
Alpha Emission of Fully Processed Silicon Wafers
Dr. Andy Mackie Indium Corporation Challenges in Supply and Testing of Ultralow Alpha-Emitting  (ULA) Solder Materials
Dr. Charles Slayman OPS a la Carte Soft Error Rates Induced by Thermal Nutrons
Dr. Brett Clark Honeywell Electronic Materials A Study of Alpha Emitting Isotope Migration Within Lead-Free Materials
Dr. Nelson Tam Marvell Alpha Particle Shielding with Cu Post Passivation Interconnect Layer


2009 Presentations


Presentations are available for download from CPMT SCV's website.

 Presenter  Affiliation  Title  Presentation 
Rick Wong Cisco Systems  Impact of Substrate SOP on Flip Chip Soft Error Rates Click to download
Brett Clark Honewell Progress Towards Standardization of Alpha Flux Measurements on Electronic Materials Click to download
Brendan Dwyer-McNally XIA, LLC Improving Accuracy of Alpha Emissivity Measurements for Wafers and Packaging Materials  Click to download
Andy Tseng ASE Global Dedicated ULA Assembly Line for Alpha Emissivity Control Click to download
Charles Slayman Sun Microsystems Alpha Particle or Neutron SER - What Will Dominate in Future IC Technology?  Click to download
Jeff Wilkinson Medtronic Soft Error Considerations for Low Power, High Reliability Applications Click to download