CFP - Reliability Aware Design

Call for Papers, IEEE Micro Special Issue on Reliability

Submissions due: February 8th, 2013  (Extension from January 8th)
Publication date: July ~ August 2013

Over the past decade, designers have sought after efficient design points with respect to power, performance and cost. Of these, power has undoubtedly emerged as a first-order design challenge. In the coming era, this challenge may be subsumed by the challenge of building robust and reliable systems. As technology advances, susceptibility of systems to transient errors, such as timing violations, parameter variations, aging and infant mortality, is steadily increasing. Without innovations in the areas of microprocessor and software reliability, future systems may face continuous failure. Thus, new computing paradigms are required that incorporate adaptive techniques at both the hardware and software layers to ensure robust and resilient execution. The system, as a whole, must dynamically detect and recover from errors to meet historically established high reliability standards without exceeding power budgets and cost constraints, and violating performance targets. To this end, the goal of this IEEE Micro issue is to seek original papers on all topics related to reliability that span the spectrum of layers in the system stack, from device, circuit and architecture design to the role of software in enabling robust and reliable computing.

Areas of interest include, but are not limited to:

 * Characterizing the overheads and/or tradeoffs between power, performance and reliability
 * Resilient circuit and memory system design
 * Emerging process technology issues
 * Case-studies, applications and experience reports on system reliability
 * Benchmarking for reliability
 * Approximate computing solutions
 * Near/Sub-threshold computing paradigm
 * Algorithmic resiliency
 * Hardware and software co-design
 * Programming and language support for reliability
 * Warehouse-scale resilient computer system design

Submission procedure:

Please log onto IEEE CS Manuscript Central ( to submit your manuscript to the Reliability" issue.  Please direct questions to the IEEE Micro magazine assistant (  For the manuscript submission, acceptable file formats include Microsoft Word and PDF. Manuscripts should not exceed 5,000 words including references, with each average-size figure counting as 150 words toward this limit. Please include all figures and tables, as well as a cover page with all the relevant author contact information (name, postal address, phone, fax, and e-mail address) and a 200-word abstract. Submitted manuscripts must not have been previously published or currently submitted for publication elsewhere, and all manuscripts must be cleared for publication. All previously published papers must have at least 30% new content compared to any conference (or other) publication. Accepted articles will be edited for structure, style, clarity, and readability. For more information, please visit the IEEE Micro Author Center (

Important dates:

Initial submissions due: Feb. 8,  2013  (Extension:  Was Jan 8, 2013)
Author notification:        Mar 19, 2013
Final version due:         Apr    9, 2013
Publication timeframe: July ~ August 2013


For any further information and questions please contact this issue's Guest Editor Vijay Janapa Reddi (