Hassan Ghasemzadeh Mohammadi, Ph.D.
Short BIO - Hassan Ghasemzadeh Mohammadi is a PostDoctoral Research Associate in the Department of Computer Science at Paderborn University (UPB) where he is a member of Computer Engineering Group (CEG). Dr. Ghasemzadeh received his Ph.D. in Computer Science from École Polytechnique Fédérale de Lausanne (EPFL), Switzerland, in 2016, where he was a member of the Integrated Systems Lab (LSI), and he completed his thesis under supervision of Prof. Giovanni De Micheli. He received his M.Sc. degree in computer engineering from the Computer Engineering Department of Sharif University of Technology, Iran, in 2008, where he was a member of Dependable System Lab (DSL). His research interests include Approximate Computing, Deep Learning accelerators for FPGA/and Embedded platforms, Logic synthesis, EDA tools for emerging technologies, and Statistical modeling of reliability. Dr. Ghasemzadeh has served as a reviewer for several journals, including IEEE TNANO, and Elsevier Microelectronics Reliability, as well as on the PC of a number of international conferences.
Short BIO - Hassan Ghasemzadeh Mohammadi is a PostDoctoral Research Associate in the Department of Computer Science at Paderborn University (UPB) where he is a member of Computer Engineering Group (CEG). Dr. Ghasemzadeh received his Ph.D. in Computer Science from École Polytechnique Fédérale de Lausanne (EPFL), Switzerland, in 2016, where he was a member of the Integrated Systems Lab (LSI), and he completed his thesis under supervision of Prof. Giovanni De Micheli. He received his M.Sc. degree in computer engineering from the Computer Engineering Department of Sharif University of Technology, Iran, in 2008, where he was a member of Dependable System Lab (DSL). His research interests include Approximate Computing, Deep Learning accelerators for FPGA/and Embedded platforms, Logic synthesis, EDA tools for emerging technologies, and Statistical modeling of reliability. Dr. Ghasemzadeh has served as a reviewer for several journals, including IEEE TNANO, and Elsevier Microelectronics Reliability, as well as on the PC of a number of international conferences.
