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Dongseok Suh

Contact
    Dongseok Suh
            Associate Professor
                Dept. of Energy Science & Center for Integrated Nanostructure Physics (DOES & CINAP/IBS)
                Sungkyunkwan University (SKKU)
                Suwon, Gyeonggido 440-746, KOREA
            energy.suh[at]skku.edu
            +82-31-299-4051
            

Education
    Physics, Seoul National University, South Korea (SNU)
            Ph.D. (1998-2002); M.S. (1996-1998); B.S. (1992-1996)
            [Supervisor (M.S. & Ph.D.) : Prof. Yung Woo Park]


Employment
    2013.03 - Present
            Associate Professor @ SKKU    (2017.03 - Present)
            Assistant Professor @ SKKU    (2013.03 - 2017.02)
                    2013.02-2013.02    Research Professor @ SKKU    
            
    2011.02 - 2013.01        
            Research Associate (Staff) @ The University of Texas at Dallas, Richardson, TX, USA
                    The Alan G. MacDiarmid NanoTech Institute [Supervisor: Prof. Ray H. Baughman]

    2003.12 - 2011.01
            Senior Engineer (Full time, Regular) @ Samsung Electronics Company, Korea
                    2008.06-2011.01    Semiconductor R&D Center (SRDC)
                    2003.12-2008.05    Samsung Advanced Institute of Technology (SAIT) 

    2002.11 - 2003.10
            Post-Doctoral Research Associate @ The University of Texas at Dallas, Richardson, TX, USA
                    Dept. of Chemistry and NanoTech Institute (Supervisor: Prof. Ray H. Baughman)
       
             
R&D Activities




Carbon Nanotube (@UTD)
                Energy Harvesting: Mechanical / Thermal to Electrical energy
Charge Injection: Tuning material property using EDLC  structure
Actuator:         CNT  yarn + Functional guest material

New Memory (@SAIT)
PRAM : Chalcogenide based phase-change memory
                - Pulse IV setup and ET characterization
                 - Device physics
                 - New electrode/PCM fabrication
RRAM : Metal-oxide based resistance-change memory
                 - Device charaterization & Device physics

Image Sensor (@SRDC)
ToF 3D-CIS : ET characterization setup & wafer-level test

Conducting Polymer (@SNU)
Polyacetylene: Doping effect on electrical transport properties
                                                        - Low temperature (~1K), High magnetic field (~30T)