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· The advanced control system allows integration of STEM, EDS, and EELS.
· The optional JEOL TEMography™ software system automatically acquires and registers images, automatically calculates the 3-D reconstruction, and provides 3-D visualization software to display and rotate the image on a variety of axes.
· The JEM-2100 has three independent condenser lenses and produces the highest probe current for any given probe size, which allows for improved analytical and diffraction capabilities.
· JEOL Alpha Selector™ allows a user the selection of a variety of illumination conditions, ranging from full convergent beam to parallel illumination.
· A high contrast aperture is available for any choice of polepiece, allowing high contrast imaging and simultaneous EDS.
Resolution
0.10nm Lattice
Accelerating
Voltage
80 to 200 kV
Magnification
x50 to 1,500,000