TEM - Transmission Electron Microscopy

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Transmission electron microscopy (TEM) is an imaging technique whereby a beam of electrons is transmitted through a thin (< 100 nm) specimen, then an image is formed, magnified and directed to appear either on a fluorescent screen or layer of photographic film , or to be detected by a sensor such as a CCD camera. The first practical transmission electron microscope was built by Albert Prebus and James Hillier at the University of Toronto in 1938 using concepts developed earlier by Max Knoll and Ernst Ruska.

 

Jeol -JEM 2010

Schematic


Different mode of operation


What we can do with this instrument-few examples:


click on the image to see bigger view



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