AND 2008 


Call for Papers



Important Dates





AND 2007 (the first workshop)

Supported by Information Retrieval Facility

Endorsed by

International Association for Pattern Recognition

Participants can submit papers in any of the relevant areas mentioned in the CFP. Submissions in PDF format should be made online at:


Note the paper submission deadline is extended to 23 May. However, authors must submit an abstract by 16 May.


Papers should not be more than 8 pages long. Please follow the SIGIR formatting instructions and use the supplied Word templates or Latex sources. Formatting guidelines from the SIGIR 2008 website:

Authors also need to apply the ACM computing classification categories and terms in the space provided in the above template.

This workshop is endorsed by IAPR. Every author must read the IAPR Ethical Requirement for Authors and in principle agree and follow them.


Each submission will get at least three reviews. Papers will be selected for oral or poster sessions based on the reviews. All accepted papers (oral and poster) will be published in the workshop proceedings.  The workshop proceedings will be published as an ACM International Conference Series Volume  and will be available on the ACM Digital Library.

Papers in which a student is the primary author (first author/presenter) will be eligible for the IAPR Best Student Paper Award. Please clearly mark a student paper at submission. The recipient will be nominated through the paper reviewing process and the final decision will be made during the workshop.


Atleast one author for each accepted oral/poster paper must register for the workshop and attend it. Limited financial assistance is available for student authors to attend the workshop.


 The best papers from the workshop will appear in a special issue of the International Journal of Document Analysis and Recognition after going through further reviewing.


Selected papers from AND 2007 appeared in a special issue of the International Journal of Document Analysis and Recognition published by Springer less than a year after the workshop date: