The use of resonant magnetic soft x-ray scattering has the potential to permit the 3D characterization of magnetic domain structures, therefore providing important information regarding their properties relevant for their use in future data storage applications. The utilidad of using synchrotron based scattering measurements has been known for over 20 years now, a comprehensive analysis of the scattering mechanism to allow for a quantitative magnetic structure determination still remains a work in progress. In this talk, I will present a generalization of an algorithm utilized for the analysis of the specular reflection signal to the off-specular case, along with results from experimental tests. These tests demonstrate that looking towards the future there is both potential, and technical challenges to overcome in the path towards a reliable and versatile tool for magnetic structure determination.