Scanning Electron Microscopy:

Scanning Electron Microscopy (SEM) allows us to obtain high-resolution, magnified images and detailed information about a sample's surface topography (shape and texture) and chemical composition. It reveals microscopic features far beyond the capabilities of optical microscopes, providing insights into the morphology, crystallographic structure, and elemental distribution of materials at the micro and nano scales. 

• Surface Topography:

Provides detailed, 3D-like surface images that reveal the texture and structure of a sample. 

• Chemical Composition:

Can identify the presence and distribution of different chemical elements within the sample's surface, often in conjunction with energy-dispersive X-ray spectroscopy (EDS). 

• Morphology and Microstructure:

Offers a detailed view of the overall shape, size, and arrangement of features within a material. 

• Crystallographic Information:

Can show information about the crystal structure and orientation of materials. 

• Focused Ion Beam (FIB) option:

Can provide nanoscale milling and nanomanipulation with the sample

Dual beam analytical FIB/SEM - Carl Zeiss CrossBeam-540:

The Zeiss CrossBeam 540 is a dual-beam focused ion beam/scanning electron microscope (FIB/SEM) system that combines a high-resolution field emission SEM with a focused ion beam to perform advanced nanoscale imaging, analysis, and material preparation. It is used for applications such as site-specific cross-sectioning, 3D tomography, and nanopatterning, enabling high-throughput analysis of novel materials and biological samples. 

Nanomanipulator FIB/SEM - ThermoFisher Scientific Helios-5CX:

The Thermo Scientific™ Helios™ 5 CX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column for ultra high-resolution imaging and the highest materials contrast with the superior Thermo Scientific™ Tomahawk HT Focused Ion Beam (FIB) Column for the fastest, easiest and most precise high-quality sample preparation. In addition to the most advanced electron and ion optics, the Helios 5 CX DualBeam incorporates a suite of state of-the-art technologies that enables simple and consistent high resolution S/TEM and TEM lamella sample preparation, as well as the highest-quality subsurface and 3D characterization, even on the most challenging samples.

High-Resolution SEM - JEOL JSM IT-800SL:

The JEOL IT-800 is a high resolution field emission gun SEM with analytical capabilities. The system is fitted with a number of detectors for imaging including: Everhart Thornley, Scintillator backscatter, inlens secondary and  backscattered electron detectors. Analytical capability is provided by a Oxford Instruments high spatial resolution windowless EDS detector.

The instrument is a Hybrid Lens (HL) version aimed at high resolution imaging and analysis. 

Smart daily-task SEM - JEOL JSM IT-200LA:

The JSM-IT200LA SEM delivers the ultimate user experience for high throughput imaging and elemental analysis. An embedded color camera simplifies specimen navigation, advanced automation delivers crisp secondary and backscatter images in seconds, and Real-Time (Live) EDS provides instant feedback of the specimen composition for intuitive operation at any experience level. This All-in-One SEM also includes high and low vacuum modes for observation of a wide range of specimen types without compromise. All of this is delivered at a great value. 

Benchtop SEM - JEOL JCM-7000 NeoScope:

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis" for finding constituent elements for an image observation area