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The Advanced Light Source's beamline 10.3.2 provides micro- XRF elemental and chemical mapping, micro X-ray Fluorescence spectroscopy and micro X-ray absorption spectroscopy at the micron scale using a monochromatic beam ranging from 2.1 to 14 keV, with a tunable spot size ranging from 1 x 1 μm up to 7 x 7 μm (H x V) to characterize environmental, geological, material, biological, biochemical and chemical samples.
The endstation provides:
Micro-focused X-ray fluorescence (XRF) mapping down to Na Kα (~1 keV), simultaneously in fluorescence and transmission modes.
Micro- focused X-ray absorption spectroscopy (XAS) from P K-edge (~2.1 keV) to Br K-edge (~13.5 keV), simultaneously in fluorescence and transmission modes.
Micro-focused X-ray fluorescence spectroscopy (XFS)
A cryogenic apparatus is under commissioning this cycle, a sample-cryoplunging station is available to users.
The beamline is currently NOT ACCEPTING USER PROPOSALS. Please check with Dula Parkinson, Diffraction and Imaging Program Lead, with questions.
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