X-ray Absorption Fine Structure (XAFS)

INSTRUMENT DETAILS

Make : RIGAKU, Japan

Model : R-XAS

MEASUREMENT SPECIFICATIONS:

1. Room temperature measurements only

2. Samples in powder form are preferred, though measurement on thin films is possible.

3. Measurement is possible for all 1st row transition metal cations (Ti to Cu) and 1 st row Lanthanides (Ce to Lu).

INFORMATION OBTAINED:

EXAFS provides precise local structural information like bond distances, coordination number and type of neighboring atoms, and disorder in crystalline or non-crystalline systems.

XANES provides the oxidation state of the absorbing ion, thus providing information related to charge transfer, orbital occupancy, and symmetry around the absorbing ion.

APPLICATIONS: Materials Science, Semiconductors, Biological Science, Nanotechnology, Pharmaceuticals