Charges: $10/sample - full run, External users $50/sample
(Future charges subject to change)
Time will be billed in 15 minute increments
PANalytical Empyrean Series 2 Powder X-Ray Diffraction (XRD) (AMCRL05)
Located in room SNR 2233.
Below the specifications is the calendar to schedule appointments, and below that is the calendar showing all scheduled reservations:
You must be logged into a @georgiasouthern.edu or Gmail account to reserve instrument time.
The PANalytical Empyrean II Powder XRD system is a versatile instrument capable of analyzing various sample types including powders, thin films, nanomaterials, and solid objects. It excels in providing high-accuracy data for phase identification, quantification, and structural analysis, including measurements of crystallographic and compositional information.
Here's a more detailed breakdown:
Sample Types:
Powders: The Empyrean is well-suited for analyzing powdered materials, offering high accuracy and data quality.
Thin Films: It can handle thin film samples, providing information about their structure and properties.
Nanomaterials: The system can characterize nanomaterials, giving insights into their crystalline structure and behavior.
Solid Objects: The Empyrean can analyze solid objects, including their internal structure and composition, with capabilities for microdiffraction and even computed tomography (CT) on some solid objects.
Capabilities:
Phase Identification: Identifies different crystalline phases present in a sample.
Phase Quantification: Determines the relative amounts of each phase.
Crystallographic Analysis: Provides detailed information about crystal structure, including unit cell parameters and lattice strain.
Compositional Analysis: Reveals the chemical composition of the sample.
Texture Analysis: Determines the preferred orientation of crystals in a sample.
Stress Measurement: Measures internal stresses within materials.
In-situ Analysis: Can perform measurements under varying temperature, atmosphere, and other conditions to study phase changes and other phenomena as they occur.
Small and Wide-Angle X-ray Scattering (SAXS/WAXS): Enables the study of both small and wide-angle scattering, providing information on both long-range and short-range order in materials.
Computed Tomography (CT): Unique capability for three-dimensional imaging of the internal structure of solid objects.
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