# Metrics about nonconformances

In this page we present some details about the metrics that we have proposed to nonconformances.

For each nonconformance (nc) we have collected two measures about the complexity to discover the nonconformance: breadth (B) and depth (D). The first is related to the number of calls into a test method realized until the nonconformance exposure. This metric is defined in Equation 1; the calls(tm) returns the sequence of method calls into the test method received as parameter. The second, is related to the depth required to find each nonconformance the internal calls performed until the contract have been violated. This metric is defined in Equation 2. Given the method that corresponds to the position in which the nonconformance was revealed, if the nonconformance is into the body of this method D receives 1, otherwise, its value is recursively increased until the method that reveals the nonconformance.

In Table 1 we present the values for metrics B and D collected for all 84 nonconformances detected by JMLOK tool in samples and real Java/JML programs.

Table 1. Nonconformances on Samples and Real programs. Column Experimental Unit shows the name of each experimental unit. Column Class shows class name that has one (or more) nonconformance(s). Column Method show the method name that has one (or more) nonconformance(s). Column Breadth (B) shows the value of the Breadth metric. And finally column Depth (D) shows the value of D metric.

Metrics-B-D-Nonconformances

We calculate the average for these metrics and obtained the following results:

• For breadth data: 2.54;
• For depth data: 2.23.

With these results we can believe that is very important to a conformance checking tool generate more than one call to the method under test. Furthermore, in our experimental units the majority of nonconformances are not simple to discover with single test cases and visual analysis.

In Table 2 we present the summarized results of these metrics for each experimental unit:

Table 2. Metrics Breadth and Depth Summarized

Metrics Summary