This instrument is configured with a CEOS probe-side aberration corrector, which provides revolutionary performance in STEM imaging and microanalysis.
Capability: Imaging single atoms, and nanoscale Chemical and Structure analysis. With <0.08 nm spatial resolution Zcontrast STEM imaging, <0.1 nm spatial resolution HRTEM imaging. It is fully equipped for analytical analysis with EDS and electron energy loss spectrometers.
Impact: Applications range from determining interface structures with sub-Ångstrom resolution and chemistry with
single-atom precision to imaging and analyzing nanoparticles in a multiple-target biomacromolecule labeling system.
Growth: The instrument was commissioned in February 2010 and has 10 research groups using it, including remote access from Puerto Rico Universities. Two industrial customers and 2 Midwest Universities are also regular users.