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Philips CM200 Ultra Twin TEM




  • Contact:
    Alex Kvit
    kvit@wisc.edu
    608-265-4458









Application data
Manual

Specifications
  • Acceleration voltage = 200 kV
  • Objective lens stability = 1 ppm
  • Spherical aberration coefficient (Cs) = 0.5mm
  • Chromatic aberration coefficient (Cc)= 1.0 mm
  • Continuous (1.4 nm steps) defocus read-out and Scherzer defocus selection 
  • Point resolution = 0.1 nm
  • Line resolution = 0.14 nm
  • TEM Magnification range: 25 x - 1.6 Mx
  • HREM Magnification range: 4.4 kx - 1.6 Mx
  • Diffraction Camera Length: 50 mm - 5500 mm
  • ZOOM and HREM lens programs
  • GE light element energy-dispersive x-ray spectroscopy (EDS), 143 eV resolution
  • Full image processing and analysis capabilities
  • Side-entry computer controlled eucentric goniometer (± 20º and ± 15º)
     Electron Source
  • Voltage ranges: 20-40-80-120-160-200 or continuous in 50V steps
  • Emission Current: 2.5 to 100 m A
  • Emitter: Lanthanum Hexaboride (LaB6)
     Illumination System Functions
  • Intensity zoom for constant intensity
  • Intensity Limit for specimen protection against overdose
  • Low Dose functions
 
     On-Line Measurements
  • Image distances and angles
  • Diffraction d-spacings and angles
  • Specimen thickness
     Modes
  • HR-TEM bright and dark filed
  • Nanoprobe
  • TEM low dose
  • Conical illumination
     Vacuum System
  • Ion getter
  • Oil diffusion
  • Cryo-trap
  • Specimen chamber = 2x10-7 torr