David Walsh, Leonid Pekelis & Ramesh Johari, 2017. Peeking at A/B tests: Why it matters, and what to do about it. In Proceedings of the 23rd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining. ACM, 2017. Among <10% of submitted papers to be selected for oral presentation. Technical companion paper. Industrial deployment white paper. Previously presented at CODE@MIT 2014 and INFORMS 2015. 

David Walsh. Bayesian A/B Testing (working paper). Upcoming presentations at CODE@MIT 2017 and INFORMS 2017. 

David Walsh & Leonid Pekelis. A/B Testing in a Changing World (working paper). Presented at CODE@MIT 2016 and INFORMS 2016.