Formation date: October 27, 2011
Investigate the allowable impurities and defects in HB-LED sapphire wafers.
This Task Force will define and/or measure critical impurities and defects in sapphire waters and the metrology intended to measure them.
The Task Force will create standards related to these impurities and defects for use by HB-LED sapphire wafer makers and producers of related devices.
Topics to be considered may include, but are not limited to:
1. Bulk Crystal Defects
2. Bulk Crystal Impurities
3. Surface Defects
4. Surface Impurities
Luke Glinski (GT Advanced Technologies)