Open systems dependability is the ability to accommodate changes in purpose, objectives, environment and actual performance and to achieve accountability continually, so as to provide expected services as and when required

Workshops on Open Systems Dependability (WOSD) have been organized in order to provide an opportunity for discussion on open systems dependability and to stimulate further research in this area. The 6th WOSD is dedicated to talks and discussions on standardisation activities in dependability and areas related to open systems dependability, such as systems assurance, risk management and asset management. The 6th WOSD is being organised as an independent meeting hosted jointly by the DEOS Association and IPA.

Past WOSDs were held as a satellite workshop of IEEE DSN (International Conference of Dependable Systems and Networks) in 2011 and 2012, as a satellite workshop of IEEE ISSRE (International Symposium on Software Reliability Engineering) from 2013 to 2015. 

Date and Venu

Saturday 21, October 2017.

G-Lab, 6F-7F Global Security Centre (East Building), Keio University 2-15-45 Mita, Minato-ku, Tokyo 108-8345

Participation

Participation free of charge.

To participate, please send an e-mail carrying your name to the following address:

Host

• DEOS Association (The Association of Dependability Engineering for Open Systems)
• IPA (Information-technology Promotion Agency)
• SDM Keio (The graduate School of System Design and Management, Keio University -- to be confirmed)

Organisers

(General Chair) Mario Tokoro (Institute for Open Systems Science, Inc.)

(Program Co-chair) Robin Bloomfield (City, University of London / Adelard)
(Program Co-chair) Yoshiki Kinoshita (Kanagawa University)

Workshop theme

Open Systems Dependability and Standardisation

Invited talks on the interactions between opens systems and related areas such as assurance, risk, asset management, and standardization effort in these areas, are given in this workshop.

Open systems dependability is ability to accommodate changes in purpose, objectives, environment and actual performance and to achieve accountability continually, so as to provide expected services as and when required.  The principal issue behind is the indeterminacy that inherently exists in long-running systems.  Systems and their environment, particularly the threat environment, changes as the time passes by and also systems looks differently from different stakeholder point of views.  Those changes and differences arises typically in SoS (System of systems), IoT (Internet of Things) as well as asset management systems.  They cause system actions that are out of control and leads to difficulties in accountability of the system under unexpected risks and their consequences.

Over the past few years, the concept and deployment of open systems dependability has been moving from the research domain (as in the DEOS project) to application and dissemination.  In particular, the activity within IEC TC 56 Dependability to develop the International Standard IEC 62853 Open systems dependability is approaching to the final stage.  This standard provides the requirements for the four system life cycle processes. IEC 62853 draft is based on ISO/IEC/IEEE 15288 System life cycle processes and has effected and been effected by other standards in related areas such as systems assurance, asset management and risk management.

Speakers and topic of the talk

The whole proceedings of the meeting is available here; some of the papers have been updated after the workshop.

The titles of papers in the following list have links to the individual papers.

2017-10-21 (Saturday) at Keio University, Mita, Tokyo.

8:30                     Registration

09:00 – 09:10       Welcome address (Tokoro, DEOS Association)

09:10 – 09:20       Orientation

09:20 – 09:50       Key note (Tokoro)

09:50 – 10:20       Coffee

10:20 – 11:50       Cross, Kennedy, Matsumoto

11:50 – 13:30       Lunch

13:30 – 15:00       Bloomfield, Rushby, Shirasaka

15:00 – 15:30       Coffee

15:30 – 17:00       Loll (read by Van Hardeveld), Van Hardeveld, Kinoshita

17:00 – 17:15       Break

17:15 – 17:45       Presentations of DEOS consortium activities

                            - Application to automotive technology SIG

                                by Yutaka Matsubara (Nagoya)

                            - Standardisation SIG

                                by Makoto Takeyama (Kanagawa)

17:45 – 18:00       Closing address (Tomita, IPA)