Workshop Overview - October 5

Synchrotron radiation is a bright and broad source of infrared light.  Synchrotron infrared beamlines worldwide have exploited this source for experiments requiring high spatial resolution or high spectral resolution.  Traditionally, high spatial resolution has meant diffraction-limited spot sizes, which in the mid-infrared is typically 2-10 um using conventional reflective objectives.  

Recently, a new form of infrared spectroscopy, called Synchrotron Infrared Nano-Spectroscopy (SINS),  has been developed that surpasses the diffraction limit by nearly three orders of magnitude, enabling broadband spectroscopy on a variety of materials with < 20 nm spatial resolution. Numerous synchrotron infrared beamlines worldwide have been adopting or plan to develop the SINS technique and other infrared near-field techniques.  This workshop will focus on these exciting developments, highlighting both instrumentation and user science.  

Recent Announcements

  • Agenda Posted!
    Posted Oct 1, 2016, 6:46 AM by Hans Bechtel
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