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Dr. Slowa Solovyov

e-mail: vfsolovyov@gmail.com

ICQ:     454358833 

Summary: Materials Scientist

  • Ph.D. in Solid State Physics in 1995.
  • 10 years of materials research at Brookhaven National Lab.
  • Co-authored 47 scientific papers, cited 323 times.
  • Licensed invention, established royalty account.

Professional experience

Materials Scientist                 Brookhaven National Laboratory, Upton, NY        2006 - present

Principal Investigator of a research program aimed to find new ways of radically improving structure quality of thick epitaxial layers of complex oxides.

  • Discovered isotropic transport in strained layers of YBCO oxide material (in collaboration with Leonardo Civale of Los Alamos Lab).
  • The program was rated 3rd out of 10 by U.S. Department of Energy review panel.
  • Implemented a new method for rapid structure and texture diagnostics of thick coatings, which enabled fast assessment of texture quality and nucleation efficiency. Tools used: Raman Microscope (JY Horiba), Buehler polisher.
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Associate Scientist                 Brookhaven National Laboratory, Upton, NY              2003 - 2006

Co-investigator of a program on study of conversion thermodynamics high-performance complex oxide layers on large area substrates ($400 K funded by DOE)

  • Established the fundamental dependence between the nucleation rate and the processing conditions.
  • Identified accumulation of secondary phases within the new phase grains as the major source of structure degradation. Tools used: X-ray diffraction analysis (Phillips diffractometer) and site-sensitive transmission electron microscopy (JEOL 3000).
  • Initiated licensing of technology for sub-atmospheric processing of large-area epitaxial layers (U.S. patent # 6,794,339), established royalty account. The technology also used at Oak Ridge National Lab (U.S.), ISTEC (Japan).
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Assistant Scientist                  Brookhaven National Laboratory, Upton, NY              2001 - 2003

As a part applied materials group investigated new ways of ultra-fast processing of epitaxial coatings.

  • Clarified critical details of the nucleation mechanism which enabled raising the nucleation rate of epitaxial layers on single-crystalline substrates. Tools used:  electron microscopy (JEOL 3000, with Dr. Wu) and X-ray diffraction (Hueber goniometer). 
  •  Developed a new technology for cost-effective deposition of fluorinated films by electrostatically assisted thermal spray with subsequent fluorination using C2H4F2 gas, patent application filed. 
  •  Invented and implemented sub-atmospheric reactor for processing of high volume of superconducting tape (with Dr. Harold Wiesmann),U.S. patent # 6,794,339. The invention enabled to increase the production rate by 500% and reduce carrier gas consumption by a factor of 100
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Research Associate                Brookhaven National Laboratory, Upton, NY              1997 - 2001

Post-doctoral research under cooperative research agreement with “Oxford Superconductor Inc.” on evaluation of applicability of a new technology for high-rate growth of thick epitaxial films.

  • Set-up high-rate e-beam gun evaporation system for deposition of thick precursor layers. Achieved 0.2 layer composition uniformity over 10 cm area at 3 micron the film thickness and the deposition rate 20 nm-s.
  • Designed and implemented a lab-scale gas flow reactor with an electronic processing atmosphere control (MSC gas flow controls, LabView software) with the atmosphere composition accuracy 0.1 ppm (residual gas analysis using Dytek quadrupole mass-spectrometer).
  • Implemented original and rapid method for in-situ reaction rate measurement during the conversion reaction, now used in ISTEC (Japan).
  • Using the reaction rate information, performed thermodynamic analysis of the growth kinetics (MatLab-FemLab package), which identified the product gas removal as the growth limiting step. This result led to invention of the sub-atmospheric reactor.
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Scientific Staff                       Kiev Institute for Metal Physics, Kiev, Ukraine           1995 - 1997

Research funded by the European Union grants for development of new civilian uses of military technologies.

  • Evaluated application of Ga-As 2D hetero-structures for solar and sensor applications (in collaboration with Kiev Institute for Semiconductors). Designed a Hall-sensor array device for 2D field mapping at cryogenic temperatures, the device is used at Institute for High Technology,Jena,Germany for characterization of cyo-magnets.
  • Established correlation between the coating texture and the 1- 10 gigahertz radiation absorption of textured carbon coatings.
  • Supported Ukrainian environmental monitoring initiative. Designed compact 100 kV X-ray source for portable X-ray fluorescence spectrometer.
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Post-graduate Researcher    Kiev Institute for Metal Physics, Kiev, Ukraine           1989 - 1995

Study of magnetic flux static and dynamic properties in perfect single crystals of oxide superconductors (Ph.D. thesis, adviser Prof. V.M . Pan).

  • Successfully synthesized large 3- 5 mm crystals by flux-melt method.
  • Established nature of magnetic flux anomaly in intermediate field. Results of the study became a basis for the Ph.D. dissertation and a publication in Phys. Rev. B.
  • Designed and built a system for high-current short pulse (up to 20 A , 10 microseconds) measurements of current-voltage characteristics in cryo-cooled small samples.

Education

Ph.D., Solid State Physics     Kiev Institute for Metal Physics, Kiev, Ukraine                                            1995  

Thesis: ”Anisotropic flux dynamics in YBCO single crystals”. Advisor: Prof. Vladimir M. Pan.

M.S., Applied Physics           Institute for Physics and Technology, Moscow, Russia                                1989

Summa Cum Laude, Fellowship for Outstanding Students.

Technical expertise

  • High-vacuum applications, thin film deposition, specializing in industrial high-rate deposition methods: CVD, PVD, ion-assisted epitaxy. Processing of epitaxial coatings of various materials.
  • Surface analysis: Auger spectroscopy, SIMS, Raman spectroscopy, scanning electron microscopy (JEOL), ellipsometry, fluorescent X-ray spectroscopy.
  • Transmission electron microscopy (JEOL 3000).
  • Auger spectroscopy (Perkin-Elmer 2000).
  • Scanning electron microscopy (JEOL 350).
  • Inductive coupled plasma analysis (JY-Horiba ULTIMA 2).
  • X-ray diffraction, texture analysis (Phillips diffractometers).
  • Ellipsometry of coatings (Woolam Ellipsometers).
  • Raman Spectroscopy (JY Horiba Spectroscope)

Professional activities

  • Referee for several international scientific journals: Superconductor Science and Technology, Physica C, IEEE Transactions, 200-2005.
  • Member of the review panel for DOE Small Business Innovative Research programs. Reviewed proposals from small companies applying for federal assistance to develop new technologies of national importance. 1999-2001.

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