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Industrial Experience with Design Patterns

Kent Beck, First Class Software gif - James O. Coplien, AT&T gif - Ron Crocker, Motorola Inc. gif - Lutz Dominick, Siemens AG gif - Gerard Meszaros, Bell Northern Research gif - Frances Paulisch, Siemens AG gif - John Vlissides, IBM Research gif





©1996 IEEE. Institute of Electrical and Electronics Engineers. Reprinted, with permission, from the Proceedings of ICSE '96.

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11259-Jim Coplien
Sat Nov 30 15:49:48 EST 1996

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